The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2010

Filed:

Sep. 06, 2007
Applicants:

Woo-seok Lee, Yongin-si, KR;

Bang-won Lee, Yongin-si, KR;

Inventors:

Woo-Seok Lee, Yongin-si, KR;

Bang-Won Lee, Yongin-si, KR;

Assignee:

Atlab Inc., , KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical position tracking device and a method of testing the same are provided. The device includes: a controller for generating at least one test operation signal in response to a command signal; a test signal generator for generating a test signal during a test operation in response to the test operation signal; a motion calculator for receiving the test signal during the test operation and performing operations in response to the test operation signal to output an output signal; and an output signal analyzer for determining whether the output signal is correct during the test operation in response to the test operation signal to output a result signal. Thus, the complexity of the method of testing the optical position tracking device can be markedly reduced and it is unnecessary to employ a high-performance test apparatus. Further, the time taken to test the optical position tracking device can be shortened by simplifying and optimizing test circumstances, and a test can be performed by connecting the optical position tracking device with a typical system, such as a personal computer (PC), instead of exclusively employing a test apparatus.


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