The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2010

Filed:

Dec. 06, 2003
Applicants:

Torsten Pechstein, Radebeul, DE;

Robert Scholz, Lüttewitz/Döbeln, DE;

Inventors:

Torsten Pechstein, Radebeul, DE;

Robert Scholz, Lüttewitz/Döbeln, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); G01N 27/26 (2006.01); G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ion-sensitive sensor arrangement includes: a semiconductor chip having a first surface, which has a media-sensitive region and at least one, first, electrical contact surface; and a support having a second surface, which faces the first surface of the semiconductor chip. An opening is provided, which aligns with the sensitive region, and at least one, second, electrical contact surface, which overlaps, or aligns with, the at least one, first, electrical contact surface. Between the support and the semiconductor chip, a preferably elastic, anisotropic conductor is arranged, which produces a conducting connection between the at least one, first, contact surface and the at least one, second, contact surface, and which has a traversing opening, which aligns with the opening, so that the sensitive region of the semiconductor chip can be contacted through the opening by an analyte. The preferably elastic, anisotropic conductor seals the region outside of the opening against contamination with the analyte.


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