The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2010
Filed:
Oct. 29, 2007
Lei LI, Shenzhen, CN;
Ping Chen, Shenzhen, CN;
Zhi Cheng, Shenzhen, CN;
Ai-ge Sun, Shenzhen, CN;
Lin-sen Dong, Shenzhen, CN;
Chang-fa Sun, Shenzhen, CN;
Lei Li, Shenzhen, CN;
Ping Chen, Shenzhen, CN;
Zhi Cheng, Shenzhen, CN;
Ai-Ge Sun, Shenzhen, CN;
Lin-Sen Dong, Shenzhen, CN;
Chang-Fa Sun, Shenzhen, CN;
Shenzhen Futaihong Precision Industry Co., Ltd., ShenZhen, Guangdong Province, CN;
FIH (Hong Kong) Limited, Kowloon, HK;
Abstract
A testing device () configured for testing a multihole workpiece () with a plurality of holes (), includes a detecting station () and an inspecting box (). The detecting station positions a plurality of detecting pins () and a plurality of detecting apparatus (). The detecting pins correspond to the holes of the multihole workpiece. The detecting apparatus respond for the multihole workpiece and sending detecting signals. The inspecting box receives the detecting signals from the detecting apparatus of the detecting station, and deals with and shows detecting results.