The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2010

Filed:

Oct. 19, 2007
Applicant:

Kiyoaki Takiguchi, Kanagawa, JP;

Inventor:

Kiyoaki Takiguchi, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A marker detection apparatus detects a marker attached to a target sample from samples flowing in a sample flow, wherein the sample flow carries a low ionization-tendency metal fine particle selected from a group of Au to Ag and the target sample labeled by the marker that is a particle of a unique vibration frequency, the marker detection apparatus including: an electromagnetic wave applying section that applies an electromagnetic wave to a path of the sample flow under a condition that the radius of the metal fine particle is smaller than the wavelength of the electromagnetic wave; and a detection section that detects vibration of the particle attached to the target sample, the vibration arising from a quasi-electrostatic field generated on the surface of the metal fine particle when the electromagnetic wave is applied to the metal fine particle around the target sample in the sample flow.


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