The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2010
Filed:
Dec. 16, 2008
Yonpyo Hon, Yamanashi, JP;
Kenzo Ebihara, Yamanashi, JP;
Akira Yamamoto, Yamanashi, JP;
Masayuki Hamura, Yamanashi, JP;
Yonpyo Hon, Yamanashi, JP;
Kenzo Ebihara, Yamanashi, JP;
Akira Yamamoto, Yamanashi, JP;
Masayuki Hamura, Yamanashi, JP;
Fanuc Ltd, Yamanashi, JP;
Abstract
There is provided a contact type measuring instrument in which the contact force of a probe is adjusted by a force created by compressed air and an attraction force between a permanent magnet and a magnetic body. This measuring instrument gives a pulling-in force or a pushing-out force to the probe by controlling a fluid pressure in a probe body. Also, between the permanent magnet attached to the tip end of a movable part of a micrometer attached to the probe body and a plate-shaped member attached to the end part on the side opposite to a contact of the probe, an attraction force according to a distance between the permanent magnet and the plate-shaped member is created.