The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2010

Filed:

Feb. 02, 2007
Applicants:

Raman S. Iyer, Redmond, WA (US);

C. James Maclennan, Redmond, WA (US);

Ioan Bogdan Crivat, Redmond, WA (US);

Inventors:

Raman S. Iyer, Redmond, WA (US);

C. James MacLennan, Redmond, WA (US);

Ioan Bogdan Crivat, Redmond, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Fields contained in data expressed as tabular data having columns and rows can initially be marked as exceptions, wherein a column within a row can be the potential cause of the exception. A user configurable parameter can be utilized to change the sensitivity or allowable exceptions for each row and/or column, to increase or decrease the number of exceptions detected. As data within each field are modified, added or deleted, or when the configurable parameter is changed, the exceptions marked can be automatically updated. Such updated exceptions can be the same or different from the initially marked exceptions. As such, a user can evaluate data and determine whether various changes within the data will change various outcomes.


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