The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2010
Filed:
Dec. 20, 2006
Udo Klein, Maximiliansau, DE;
Thomas Gerhard Wieczorek, Meckesheim, DE;
Daniel Zimmermann, Leimen, DE;
Oliver Sievi, Sandhausen, DE;
Guenter Pecht-seibert, Muehlhausen, DE;
Udo Klein, Maximiliansau, DE;
Thomas Gerhard Wieczorek, Meckesheim, DE;
Daniel Zimmermann, Leimen, DE;
Oliver Sievi, Sandhausen, DE;
Guenter Pecht-Seibert, Muehlhausen, DE;
SAP AG, Walldorf, DE;
Abstract
A method and system to evaluate process objects for acceptability for use. New metrics that measure both object components and their relationships are used. The method selects metrics for the process objects that measure both the components and their relationships, compares measurements of the selected metrics with corresponding metric norms, and, based on the comparison, determines whether the process objects are acceptable. The system includes a memory to store metrics and process objects and a processor to select applicable metrics for the process objects, calculate the measurements of the selected metrics, compare the measurements to corresponding metric norms, and, based on the comparison, determine whether the process objects are acceptable.