The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2010

Filed:

Dec. 05, 2008
Applicant:

Gregory Charles Walsh, Walnut Creek, CA (US);

Inventor:

Gregory Charles Walsh, Walnut Creek, CA (US);

Assignee:

Leica Geosystems AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An embodiment of the invention includes using a set of telescopes to calibrate a three dimensional optical scanner. Three separate calibrations are disclosed for a survey grade calibration: () angular calibration, implemented using at least one anti-podal pair of telescopes, () range calibration, implemented using at least one telescope mounted fiber recirculator, and () tilt calibration, implemented using at least one pair of telescopes not mounted in anti-podal configuration and an integral tilt table. Methods for aligning or measuring the mis-alignment between anti-podal telescope pairs are also described.


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