The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2010

Filed:

Dec. 10, 2008
Applicants:

Lam Huy Nguyen, Laurel, MD (US);

Jeffrey P. Sichina, Ocean View, DE (US);

Inventors:

Lam Huy Nguyen, Laurel, MD (US);

Jeffrey P. Sichina, Ocean View, DE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for generating images from projection data; a preferred embodiment comprising inputting projection data from at least one receiving element; generating a first aperture or array of data points containing positional and signal data; arbitrarily and/or randomly removing data points from the first array to form a series of subarrays comprising different sets of data points; generating preliminary images from the subarrays; comparing the corresponding image pixels from two preliminary images to determine for each pixel location the lesser or equal pixel values; forming a merged image from the lesser or equal pixel values; and repeating the comparison of corresponding image pixels of another preliminary image to the merged image to determine the lesser or equal pixel values until a merged image of the desired quality is obtained. A preferred embodiment of the system may comprise at least one processor, comparator and/or image generator.


Find Patent Forward Citations

Loading…