The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2010

Filed:

Aug. 09, 2004
Applicants:

Eric Nadeau, Lachine, CA;

Myriam Pages, Montréal, CA;

Danny Roberge, St-Bruno, CA;

Alain Roy, Lemoyne, CA;

Martin Léger, St-Lazare, CA;

Inventors:

Eric Nadeau, Lachine, CA;

Myriam Pages, Montréal, CA;

Danny Roberge, St-Bruno, CA;

Alain Roy, Lemoyne, CA;

Martin Léger, St-Lazare, CA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and an apparatus to obtain a surface mapping of a ballistic piece of evidence (BPOE) under examination, such as a bullet or a spent cartridge case, that can be used thereafter as a 3D signature for identifying purpose during ballistic test comparison. The method comprises providing a measurement unit adapted to acquire a relief map of the surface of the BPOE and acquiring with the measurement unit the relief map of the surface to thereby obtain the mapping of the surface of the BPOE. Preferably, the measurement unit of the present invention comprises a confocal sensor such as confocal microscope. Also, the present invention includes acquiring the relief map of the bullet surface or of the cartridge case surface by acquiring and assembling a mosaic of regional reliefs that are partly overlapping with their surroundings regional reliefs.


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