The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2010
Filed:
Nov. 27, 2007
Seiji Ito, Kyoto, JP;
Seiji Ito, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
An X-ray fluoroscopic system which is capable of highly accurately performing tilting tracking or rotational tracking by a simple operation in an observation work without inputting a distance from the surface of a table and an observed point of an object of fluoroscopy and without performing a calibration operation for obtaining the distance in advance. The X-ray fluoroscopic system having a tracking function of obtaining a moving amount of the table, which is necessary for performing tilting or rotational tracking, and moving the table, based on an arithmetic operation using a distance h obtained by totalizing a distance d from the surface of the table to an observed point V, and a distance z from the surface of the table to an X-ray focal point, a defined value or arbitrary input value is used as an initial value of the distance h, and a shift amount of the observed point V occurred from tracking is used to update the distance h by specifying the observed point V on a screen after tracking, thereby tilt (rotation) tracking accuracy is gradually improved.