The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2010
Filed:
Sep. 13, 2007
Bassam Amanallah Saadany, Nasr, EG;
Diaa Abdelmaguid Khalil, Nasr, EG;
Tarik Essif Eddine Bourouina, Allaire, FR;
Bassam Amanallah Saadany, Nasr, EG;
Diaa Abdelmaguid Khalil, Nasr, EG;
Tarik Essif Eddine Bourouina, Allaire, FR;
Si-Ware Systems, Cairo, EG;
Abstract
A micromachined interferometer is achieved using a half plane beam splitter. The beam splitter is optically coupled to receive an incident beam and operates to split the incident beam into two interfering beams, each propagating in a different medium. A fixed mirror embedded in one of the mediums reflects one of the interfering beams back towards the half plane beam splitter through such medium, while a moveable mirror, which is controlled by an actuator, reflects the other interfering beam back towards said half plane beam splitter through the other medium. A detection plane detects an interference pattern produced as a result of interference between the reflected interfering beams.