The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2010
Filed:
Feb. 25, 2008
Alan M. Ganz, Scarsdale, NY (US);
Henry C. Weber, Scarsdale, NY (US);
Alan M. Ganz, Scarsdale, NY (US);
Henry C. Weber, Scarsdale, NY (US);
August Ninth Analyses, Inc., Scarsdale, NY (US);
Abstract
A method for determining characteristics of a material includes illuminating the material with coherent light so as to produce scattered light; autocorrelating the scattered light; preprocessing a signal representative of the scattered light to produce a processed signal; and associating the analyzed data with particular characteristics of the material. At least one of a cumulant analysis and a cluster analysis may be performed to provide analyzed data. The determined characteristics may be used for real time control or termination a process used to alter the characteristics of the material. Specifically, monitoring of a process for changes in particle size as a function of time or to determine various physical and/or chemical characteristics of the particles or a mixture containing same, including homogeneity, may be achieved. An apparatus operating generally in accordance with the method is also disclosed.