The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2010

Filed:

Aug. 22, 2005
Applicants:

Takanori Yasui, Yokohama, JP;

Masato Hashizume, Yokohama, JP;

Yoshihisa Ikeda, Yokohama, JP;

Chikashi Hashimoto, Yokohama, JP;

Hiroyuki Iwaki, Yokohama, JP;

Inventors:

Takanori Yasui, Yokohama, JP;

Masato Hashizume, Yokohama, JP;

Yoshihisa Ikeda, Yokohama, JP;

Chikashi Hashimoto, Yokohama, JP;

Hiroyuki Iwaki, Yokohama, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An abnormality in operation is detected by meticulously monitoring the operation of a monitored device that comprises a state machine. The state number, indicating the state the monitored device is currently in, is output from the device. The upper and lower limit values of current consumption is set for each state number. A monitoring circuit, using the upper and lower limit values for the present state number, judges the value of current consumption detected by a current detection circuit and detects whether there is abnormality in operation.


Find Patent Forward Citations

Loading…