The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2010
Filed:
Nov. 28, 2007
Chih-yuan Hsieh, Taichung County, TW;
Chun-wen Yeh, Hsinchu County, TW;
Chih-Yuan Hsieh, Taichung County, TW;
Chun-Wen Yeh, Hsinchu County, TW;
MStar Semiconductor, Inc., ChuPei, Hsin-Chu Hsien, TW;
Abstract
A test system for testing operability of integrated circuits includes: a first IC, for modulating a first signal to generate a first modulated signal and transmitting the first modulated signal, and for receiving a second modulated signal and demodulating the second modulated signal to generate a second signal; a first loop antenna, coupled to the first IC, for receiving the first modulated signal and sending the first modulated signal back to the first IC as the second modulated signal; and a tester circuit coupled to the first IC, for generating the first signal to the first IC, receiving the second signal from the first IC, and comparing the first signal and the second signal to determine the operability of the first IC.