The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2010

Filed:

May. 02, 2006
Applicant:

Mark Bydder, San Diego, CA (US);

Inventor:

Mark Bydder, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for magnetic resonance imaging (MRI) including obtaining a plurality of MRI images acquired at different echo times subsequent to an excitation pulse applied to a sample which is being imaged, performing a curve-fitting for a specified variation in each pixel of the MRI images, and using fitted parameters for the specified variation in the MRI images to synthesize the MRI images to form an image at any echo time with reduced noise. Performing singular value decomposition to determine the types of variation in each pixel of the MRI images and using only the most significant variations to synthesize the MRI images to form an image with reduced noise.


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