The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2010
Filed:
Jun. 21, 2004
Takashi Fujita, Hyogo, JP;
Sachiko Yamamoto, Hyogo, JP;
Hiroyuki Yamada, Hyogo, JP;
Wataru Akahane, Hyogo, JP;
Takashi Fujita, Hyogo, JP;
Sachiko Yamamoto, Hyogo, JP;
Hiroyuki Yamada, Hyogo, JP;
Wataru Akahane, Hyogo, JP;
Wako Pure Chemical Industries, Ltd., Osaka-shi, JP;
Abstract
The present invention discloses a method for measuring an amount of an objective component to be measured in a sample, which comprises; preventing an electric charge in an atmosphere in a photometry chamber from transferring to the surface of a solution which generates light due to an energy variation of a substance induced by the objective component in the sample, measuring value of the light, and determining an amount of the objective component in the sample on the basis of the measured value thus obtained, and an instrument used for the method. According to the present invention, in measurement of an objective component in a sample using a spectrophotometer, problems such as between-day variation of signal values or increase of background value, etc. can be solved, and a trace component can be measured in high accuracy and high sensitivity.