The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2010
Filed:
Jul. 07, 2009
Stephen Coggeshall, Los Alamos, NM (US);
Allen Jost, Coronado, CA (US);
Joseph Blue, San Diego, CA (US);
Christer J. Dichiara, San Diego, CA (US);
Mike Cook, Poway, CA (US);
Xuhul Shao, Palo Alto, CA (US);
Stephen Coggeshall, Los Alamos, NM (US);
Allen Jost, Coronado, CA (US);
Joseph Blue, San Diego, CA (US);
Christer J. Dichiara, San Diego, CA (US);
Mike Cook, Poway, CA (US);
Xuhul Shao, Palo Alto, CA (US);
ID Analytics, Inc., San Diego, CA (US);
Abstract
A method for using transaction records to detect fraud, including receiving a plurality of identity records comprising identity related information; receiving a plurality of transaction records comprising transaction information from a plurality of client institutions; linking the plurality of identity records with each other based on the identity related information; linking the plurality of transaction records with the identity records, wherein a link between a transaction record and an identity record is created when a characteristic of the transaction information of the transaction record is similar to a characteristic of the identity related information of the identity record, the links forming a graphical pattern; and performing statistical analysis of the graphical pattern to detect fraud, wherein the statistical analysis comprises analyzing the graphical pattern to determine whether the graphical pattern is anomalous when considered in relation to a normal graphical pattern.