The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2010

Filed:

Sep. 11, 2008
Applicants:

Hassan Tanbakuchi, Santa Rosa, CA (US);

Matthew Richter, Santa Rosa, CA (US);

Michael Whitener, Loveland, CO (US);

Inventors:

Hassan Tanbakuchi, Santa Rosa, CA (US);

Matthew Richter, Santa Rosa, CA (US);

Michael Whitener, Loveland, CO (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 30/00 (2010.01); G01N 13/00 (2006.01); G01N 23/00 (2006.01); H01L 41/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A signal coupling system interposed between a scanning probe and a measurement instrument provides signal communication between the scanning probe and the measurement instrument. The signal coupling system has a pre-stressed shape when the scanning probe is in a neutral position. The pre-stressed shape is designated to provide a characteristic impedance of the signal coupling system that varies linearly as a function of displacement of the scanning probe from the neutral position when the scanning probe is displaced, relative to the neutral position, over a designated range of displacements.


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