The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7793239 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 07, 2010

Filed:

Apr. 24, 2006
Applicants:

James J. Engel, Cambridge, VT (US);

Susan K. Lichtensteiger, Essex Junction, VT (US);

Paul J. Sulva, Jericho, VT (US);

Larry Wissel, Williston, VT (US);

Inventors:

James J. Engel, Cambridge, VT (US);

Susan K. Lichtensteiger, Essex Junction, VT (US);

Paul J. Sulva, Jericho, VT (US);

Larry Wissel, Williston, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system of modeling power leakage for a design comprises providing one or more cell libraries comprising parameters for particular device characteristics and providing a module configured to determine of cell leakages of a device for a PVT corner. In determining the cell leakage, the module uses the device characteristics contained in the one or more cell libraries, in combination with one or more components at a PVT for a predetermined application and an amount of devices in a leakage path (Fckt) and a leakage distribution (Fchip). There is no need to recharacterize the one or more cell libraries.


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