The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2010
Filed:
May. 29, 2008
Shanmuganathan Gnanasambandam, Webster, NY (US);
Naveen Sharma, Fairport, NY (US);
Shanmuganathan Gnanasambandam, Webster, NY (US);
Naveen Sharma, Fairport, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A system and method for serverless distributed monitoring anomaly detection for a service oriented architecture is provided. The method includes selecting a number of nodes, e.g. super peers, to form an overlay network which is configured to facilitate bidirectional information flow creating a peer-to-peer monitoring framework through replication chains. The method continues with mapping the overlay network to data by assigning each of the selected nodes to a data region related to its surroundings. The method continues with distributing the data regions among the nodes via the aforementioned replication chain, where each replication chain is sensitive to the type of application that requests data duplication in monitoring the data by collecting information from each of those nodes that correspond to an assigned or distributed data region. This method may also include taking corrective action if the node detects an anomaly.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile