The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7792655 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 07, 2010

Filed:

Jul. 09, 2008
Applicants:

Chih-kuang Chang, Taipei Hsien, TW;

Yi-rong Hong, Shenzhen, CN;

LI Jiang, Shenzhen, CN;

Zhong-kui Yuan, Shenzhen, CN;

Inventors:

Chih-Kuang Chang, Taipei Hsien, TW;

Yi-Rong Hong, Shenzhen, CN;

Li Jiang, Shenzhen, CN;

Zhong-Kui Yuan, Shenzhen, CN;

Assignees:

Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer-implemented method for scanning and obtaining points of an object is provided. The method includes defining a measuring distance between two points of an object and scanning the measuring distance according to an optimal measuring position. If coordinate values of each of the scanned points are valid, then the method send the obtained coordinate values to an electronic device if the obtained coordinate values are valid.


Find Patent Forward Citations

Chang, Chih-Kuang. (2010). System and method for scanning and obtaining points of an object (U.S. Patent No. 7792655). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7792655

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