The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2010

Filed:

Jun. 05, 2002
Applicants:

Bruno Liege, Boulogne, FR;

Frederic Guichard, Paris, FR;

Jean-marc Lavest, Clermont-Ferrand, FR;

Inventors:

Bruno Liege, Boulogne, FR;

Frederic Guichard, Paris, FR;

Jean-Marc Lavest, Clermont-Ferrand, FR;

Assignee:

DO Labs, Boulogne, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system with which quality of an image derived from or addressed to a chain of appliances can be modified. Formatted information related to defects of the appliances is employed. The method and system: compile directories of sources of formatted information related to the appliances, search automatically for the formatted information related to the appliances, and modify the image automatically by image-processing software and/or image-processing components by taking into account the obtained formatted information. The formatted information can be modified as a function of variable characteristics of the image to be processed and/or the appliances. With the method and system it is possible to process images derived from appliances that have diverse origins and that have been commercialized gradually over time. Such a method and system are applicable to processing of photographic or video images and in optical instrumentation, industrial controls, robotics, metrology, etc.


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