The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2010
Filed:
Jun. 15, 2006
Applicants:
Toyohisa Matsuda, Matsudo, JP;
Richard John Campbell, Camas, WA (US);
Inventors:
Toyohisa Matsuda, Matsudo, JP;
Richard John Campbell, Camas, WA (US);
Assignee:
Sharp Laboratories of America, Inc., Camas, WA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Embodiments of the present invention comprise systems, methods and devices for detection of image regions using a masking condition and an entropy measure.
Matsuda, Toyohisa. (2010). Methods and systems for detecting regions in digital images (U.S. Patent No. 7792359). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7792359
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile