The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2010

Filed:

May. 16, 2006
Applicants:

Jean Lienard, Igny, FR;

Francisco Sureda, Chatenay Malabry, FR;

Inventors:

Jean Lienard, Igny, FR;

Francisco Sureda, Chatenay Malabry, FR;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for automatically estimating a correction to be made to an image deformed with respect to a sequence of images. The method includes detecting of information pixels in the images; calculation of a region of interest located in a binary mapping image made from the images; for each image, search in the image, for the position of a mobile region that maximizes a similarity criterion to the region; and the estimated correction to be made to the image is compared with each image being the affine transformation of the mobile region moving from its found position at which similarity criterion is maximized to the region. The correction is only applied if the balance is equal to the improvement to the similarity criterion in the region of interest and the deterioration of the similarity criterion outside the region of interest is positive.


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