The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2010
Filed:
Aug. 11, 2005
James V. Bacus, Downers Grove, IL (US);
James W. Bacus, Oakbrook, IL (US);
James V. Bacus, Downers Grove, IL (US);
James W. Bacus, Oakbrook, IL (US);
Olympus America Inc., Center Valley, PA (US);
Abstract
A method and apparatus for creating a magnified composite image of a microscope specimen comprises making error corrections for imprecise movements of the specimen relative to an objective lens when capturing data for first and second images. A correction offset is computed based on a comparison of data for overlapped portions of the first and second images and then the specimen is moved through a distance modified by the correction offset for capture of a subsequent tiled image. Image center portions are retained as the data structure tile. The area about the center portion is used to align images and to compensate for stage inaccuracies and to provide a feedback signal for a drive system. Differences in X, Y coordinates for macro and micro view images may be used as navigation offsets to view a selected point for the micro image marked on the macro image.