The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2010
Filed:
Jun. 28, 2005
Applicants:
Helmut Strecker, Hamburg, DE;
Gabriel Zienert, Hamburg, DE;
Armin Schmiegel, Hamburg, DE;
Inventors:
Assignee:
Morpho Detection, Inc., Newark, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to a method of examining an item of luggage, in which an X-ray fluoroscopic image of the whole item of luggageis produced first, then planiform suspect regionsin the X-ray fluoroscopic image are determined and the scanning time during the following production of an X-ray diffraction image depends on whether the X-ray beam is located specifically in a planiform suspect region, wherein the scanning time heads towards zero outside a planiform suspect regionand lasts long enough inside a planiform suspect regionto obtain an informative X-ray diffraction image.