The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2010
Filed:
Jun. 13, 2005
Shingo Yamanouchi, Tokyo, JP;
Kazuaki Kunihiro, Tokyo, JP;
Shingo Yamanouchi, Tokyo, JP;
Kazuaki Kunihiro, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
An evaluation method for linearity evaluations neither performing calculations of error vectors at multiple sampling points nor using a demodulator corresponding to a desired modulation scheme. Measuring devices (and) measure the input signal and the output signal of an evaluation object (), to which a predetermined evaluation signal has been inputted. An evaluation unit () uses the input signal and the output signal of the evaluation object (), to determine at least one of an amplitude distortion or a phase distortion of the output signal. An integration unit () uses the distortions to perform the integrations weighted by the probability density function of the power-to-average ratio of a predetermined modulated signal. A linearity index calculation unit () calculates a linearity index from the results of processing by the integration unit ().
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile