The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2010
Filed:
Dec. 19, 2006
Jae-cheol Bae, Suwon-si, KR;
In-oh Hwang, Seongnam-si, KR;
Kyung-geun Lee, Seongnam-si, KR;
Hui Zhao, Suwon-si, KR;
Narutoshi Fukuzawa, Tokyo, JP;
Takashi Kikukawa, Tokyo, JP;
Tatsuhiro Kobayashi, Tokyo, JP;
Jae-cheol Bae, Suwon-si, KR;
In-oh Hwang, Seongnam-si, KR;
Kyung-geun Lee, Seongnam-si, KR;
Hui Zhao, Suwon-si, KR;
Narutoshi Fukuzawa, Tokyo, JP;
Takashi Kikukawa, Tokyo, JP;
Tatsuhiro Kobayashi, Tokyo, JP;
TDK Corporation, Tokyo, JP;
Abstract
A method of optimizing a writing condition of an optical recording medium, including writing test pattern data with the writing condition on the optical recording medium, comparing an error pattern binary signal detected by reproducing the written test pattern data with a correct pattern binary signal of the test pattern data, and determining an optimum writing condition of the optical recording medium based on a result of the comparison.