The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2010

Filed:

Oct. 28, 2008
Applicant:

Yasuharu Nakajima, Yokohama, JP;

Inventor:

Yasuharu Nakajima, Yokohama, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A microscope for focusing by inserting a split prism at a focusing support time. The image of an iris stop is branched into such two images by the angle deflecting action of the split prism as are individually shifted and focused at symmetric positions across the optical axis of the microscope. These two branched images of the iris stop are further focused on an objective lens through a beam splitter by the focusing action of a lens. The operation unit of a vertical motion device is operated to move an optical system up and down so that the images of a focused pattern are viewed to move in opposite directions from each other in the field of view.


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