The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2010
Filed:
Jul. 25, 2006
Kuo-jeng Wang, FangKung Li, HsiaoKang District, KaoHsiung, TW;
Kuo-Jeng Wang, FangKung Li, HsiaoKang District, KaoHsiung, TW;
Other;
Abstract
The present disclosure provides a repeated sampling method for image scanning. In one or more embodiments, the sampling method may comprise a sample treatment procedure for the data of an image scanning device during the scanning of an image. The method may comprise sampling, sorting, eliminating one or more group-departing values, and getting a mean value, etc. The sampling procedure may involve scanning a single point of the image several times to produce several sets of sampling values. The sorting procedure may involve sorting the several sets of sampling values after being sampled according to their magnitude. The eliminating group-departing values procedure may involve obtaining the relatively larger values and relatively smaller values from the several sets of sampling values after being sorted. The getting mean value procedure may involve obtaining a mean value from the several sets of sampling values. By applying the repeated sampling method the error of data pick-up during the procedure of scanning may be reduced.