The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2010
Filed:
May. 25, 2007
Qing-shan Cao, Shenzhen, CN;
Wen-bo Fa, Shenzhen, CN;
Xu-chen Mu, Shenzhen, CN;
Jiang-yong Zhou, Shenzhen, CN;
Qing-Shan Cao, Shenzhen, CN;
Wen-Bo Fa, Shenzhen, CN;
Xu-Chen Mu, Shenzhen, CN;
Jiang-Yong Zhou, Shenzhen, CN;
Ensky Technology (Shenzhen) Co., Ltd., Shenzhen, Guangdong Province, unknown;
Ensky Technology Co., Ltd., Pan Chiao, Taipei Hsien, TW;
Abstract
A system for testing a reflective display device includes a testing apparatus and a computer. The testing apparatus includes one or more light emitters, one or more light detectors, an analog-to-digital converter (ADC) module, and a microcontroller unit (MCU). The light emitters are for projecting light onto a reflective display device located on the testing apparatus. The light detectors are for sensing reflected light from the reflective display device, and generating electricity according to a luminance of the reflected light. The ADC module is for receiving the electrical signals from the light detectors, and producing a digital output according to voltages of the electrical signals. The MCU is configured for reading the digital output of the ADC module. The computer is for processing the digital output and displaying results after processing.