The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2010
Filed:
Oct. 30, 2007
Justin Esher, Colorado Springs, CO (US);
Nicholas Gamroth, Chicago, IL (US);
James Dean, Hanscom AFB, MA (US);
John S. Derov, Lowell, MA (US);
Justin Esher, Colorado Springs, CO (US);
Nicholas Gamroth, Chicago, IL (US);
James Dean, Hanscom AFB, MA (US);
John S. Derov, Lowell, MA (US);
The United States of America as represented by the Secretary of the Air Force, Washington, DC (US);
Abstract
An automated computer controlled electrical materials characterization system in which a material sample is subjected to focused near field polarization controlled microwave electrical energy radiation. Response of the material sample to either of reflected or transmitted/refracted microwave radiation is determined by a microwave energy sensor disposable in a range of physical locations with respect to the sample. Automated and unattended operation of the characterization system by way of disclosed computer software is provided. Computer positioned, lens equipped, microwave antenna horn elements provide source and reception functions for the sample received and discharged microwave radiation. Output signal polarization response from the sample examination is especially considered. The disclosed system is especially suited to characterization of 'negative index' electrical materials and has utility with a variety of other materials.