The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2010

Filed:

Jun. 13, 2008
Applicant:

Hitoshi Ikeda, Tokyo, JP;

Inventor:

Hitoshi Ikeda, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for generating an image, based on a plurality of magnetic resonance signals received and obtained by a plurality of RF coils by scanning a subject lying within a static magnetic field space by the RF coils in accordance with a parallel imaging method, including: a first step for selecting a reference magnetic resonance signal used as a reference from the magnetic resonance signals, based on profiles of the magnetic resonance signals; a second step for calculating a frequency difference corresponding to a difference between a frequency maximum in signal intensity at the reference magnetic resonance signal selected at the first step, and a frequency at the center of a k space; a third step for setting the frequency difference calculated at the second step as a displacement for displacing all the magnetic resonance signals, and displacing the magnetic resonance signals, based on the displacement; and a fourth step for executing half echo processing on the magnetic resonance signals displaced at the third step.


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