The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2010

Filed:

Sep. 07, 2007
Applicants:

Seung Jean Kim, Palo Alto, CA (US);

John M. Pauly, Stanford, CA (US);

Michael Lustig, Stanford, CA (US);

Inventors:

Seung Jean Kim, Palo Alto, CA (US);

John M. Pauly, Stanford, CA (US);

Michael Lustig, Stanford, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for magnetic resonance imaging (MRI) is provided. A scanning path is specified. Gradient amplitude is determined as a function of arc-length along the scanning path in k-space. A time optimal gradient waveform for scanning the scanning path is calculated from the gradient amplitude. The scanning path is scanned using the time optimal gradient waveform.


Find Patent Forward Citations

Kim, Seung. (2010). Mri method of determining time-optimal gradient waveforms with gradient amplitude as a function of arc-length in k-space (U.S. Patent No. 7791338). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7791338

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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