The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2010

Filed:

Dec. 19, 2006
Applicants:

Morio Takahashi, Tokyo, JP;

Hiroyuki Yamazaki, Tokyo, JP;

Yukari Deki, Tokyo, JP;

Inventors:

Morio Takahashi, Tokyo, JP;

Hiroyuki Yamazaki, Tokyo, JP;

Yukari Deki, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/544 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a hybrid mounted device that includes a element such as semiconductor laser diode (LD), and a board such as a silicon platform having formed thereon an optical waveguide. The LD is mounted to the silicon platform, and is optically coupled to the optical waveguide. The mounting position of the LD is determined by positioning first alignment marks formed on the board and second alignment marks formed on the LD. In this configuration, initial positional deviation amount measuring marks that can measure the initial positional deviation amount of the first alignment marks themselves are formed on the board. The mounting position of the is corrected to a position where the second alignment marks are shifted with respect to the first alignment marks according to the initial positional deviation amount measured from the initial positional deviation amount measuring marks.


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