The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2010
Filed:
Nov. 21, 2006
Applicants:
Mark Wang, San Diego, CA (US);
Wenyi Feng, San Diego, CA (US);
Robert Kain, San Diego, CA (US);
Inventors:
Assignee:
Illumina, Inc., San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A line scanning arrangement for imaging microarrays includes a line illuminator that converts output from one or more lasers to a radiation line. The laser output passes through a single mode fiber and a module that converts the laser light to the radiation line. The line is confocally directed to sites on the microarray, and retrobeams returned from the sites are collected on an imaging detector. The microarray is moved in the imaging apparatus so as to progressively illuminate an array or matrix of sites for imaging.