The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2010
Filed:
Mar. 04, 2005
Chisato Yoshimura, Nagoya, JP;
Hideo Nakano, Iwakura, JP;
Takanori Ishishika, Nagoya, JP;
Brother Kogyo Kabushiki Kaisha, Nagoya, JP;
Abstract
A test object receptacle, capable of measuring a test object in a wide range of concentrations with good accuracy and within a short time, contains a plurality of fine protruding portions inside grooves. The test object receptacle can fix antigens, antibodies and test objects faster than without the protruding portions. Furthermore, the protruding portions are so formed that the surface area thereof increases gradually to the downstream with respect to the movement direction of the test object in the grooves, the detection intensity (intensity of color development) of the test object is not saturated downstream of the grooves even when the test object has a high concentration. For this reason, the test object can be detected within a short time and the measurements can be conducted within a wide concentration range.