The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2010

Filed:

Apr. 19, 2007
Applicants:

Hiroki Yoshikawa, Joetsu, JP;

Yukio Inazuki, Joetsu, JP;

Satoshi Okazaki, Joetsu, JP;

Takashi Haraguchi, Tokyo, JP;

Tadashi Saga, Tokyo, JP;

Yuichi Fukushima, Tokyo, JP;

Inventors:

Hiroki Yoshikawa, Joetsu, JP;

Yukio Inazuki, Joetsu, JP;

Satoshi Okazaki, Joetsu, JP;

Takashi Haraguchi, Tokyo, JP;

Tadashi Saga, Tokyo, JP;

Yuichi Fukushima, Tokyo, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A photomask blank has a light-shielding film composed of a single layer of a material containing a transition metal, silicon and nitrogen or a plurality of layers that include at least one layer made of a material containing a transition metal, silicon and nitrogen, and has one or more chrome-based material film. The high transition metal content ensures electrical conductivity, preventing charge-up in the photomask production process, and also provides sufficient chemical stability to cleaning in photomask production. The light-shielding film has a good resistance to dry etching of the chrome-based material film in the presence of chlorine and oxygen, thus ensuring a high processing accuracy.


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