The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2010

Filed:

Dec. 28, 2006
Applicant:

Masanori Nakaya, Kobe, JP;

Inventor:

Masanori Nakaya, Kobe, JP;

Assignee:

Sysmex Corporation, Kobe-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is to present a sample image obtaining system that can manage a smear slide easily and perform the operation from the preparation of a smear slide to imaging efficiently. The sample image obtaining system comprises: a sample smearing means for smearing a sample on a slide glass; an identification information reading means for reading identification information of the sample smeared on the slide glass, the slide glass having the identification information; a sample image obtaining means for obtaining an image of the sample smeared on the slide glass; a storing means for storing the image obtained by the sample image obtaining means and the identification information read by the identification information reading means; and a slide glass transferring means for transferring the sample smeared slide glass from the sample smearing means to the sample image obtaining means.


Find Patent Forward Citations

Nakaya, Masanori. (2010). Sample image obtaining apparatus, sample image obtaining system, and method for obtaining sample image (U.S. Patent No. 7790107). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7790107

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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