The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2010

Filed:

Jun. 27, 2008
Applicants:

Alfred Affa, Stein/Traun, DE;

Johannes Haunreiter, Burghausen, DE;

Inventors:

Alfred Affa, Stein/Traun, DE;

Johannes Haunreiter, Burghausen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 5/347 (2006.01);
U.S. Cl.
CPC ...
Abstract

A linear measuring arrangement for measuring a relative position of two objects. The linear measuring arrangement includes a unit having a housing and a scale in the housing and a scanning unit, which can be shifted relative to the unit in a measuring direction, wherein the scanning unit is arranged inside the housing and includes a heat-generating electrical component. The arrangement further includes a mounting piece, which is fastened to the scanning unit by a coupling, which is rigid in the measuring direction and resilient transversely thereto, and which extends to a mounting area arranged outside of the housing. The arrangement further includes a heat-conducting element, which is designed for transferring heat generated by the heat generating electrical component to the mounting piece and permits relative movements between the mounting piece and the scanning unit at least transversely to the measuring direction.


Find Patent Forward Citations

Loading…