The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2010
Filed:
Jul. 20, 2009
Yonpyo Hon, Yamanashi, JP;
Kenzo Ebihara, Yamanashi, JP;
Akira Yamamoto, Yamanashi, JP;
Masayuki Hamura, Yamanashi, JP;
Yonpyo Hon, Yamanashi, JP;
Kenzo Ebihara, Yamanashi, JP;
Akira Yamamoto, Yamanashi, JP;
Masayuki Hamura, Yamanashi, JP;
Fanuc Ltd, , JP;
Abstract
In a machine tool having an on-board measuring machine and controlled by a numerical controller, a method of measuring a shape of a workpiece presets a reference point for temperature drift correction on the workpiece, moves a probe to the reference point, resets a coordinate system of the probe to correct a temperature drift of the probe, and carries out shape measurement of the workpiece along a first measuring path. Next, the method moves the probe to the reference point again, resets the coordinate system of the probe to correct a temperature drift of the probe again, and carries out shape measurement of the workpiece along a second measuring path. Thereafter, similar temperature drift correction is carried out for each measuring path until the shape measurement of the workpiece is carried out along the last measuring path.