The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Jan. 05, 2010
Ching-wen Hsueh, Luodong Town, TW;
Shih-hsin Chen, Jhubei, TW;
Ching-Wen Hsueh, Luodong Town, TW;
Shih-Hsin Chen, Jhubei, TW;
Mediatek, Inc., Taiwan, CN;
Abstract
Apparatuses and methods for defect replacement when an optical storage medium is read are provided. When the defect management is LOW, a pick-up head retrieves a set of data from the optical storage medium; a defect detector detects whether there is a defect in the set; if yes, a processor determines whether a replacement for the defect is in the set; and if yes, an interface transmits the replacement from the set. When the defect management is CRD, a buffer temporarily stores data retrieved from the optical storage medium; a defect detector detects whether there is a set of defects in the data; if yes, a comparator compares a length of the set of defects with a defect threshold length; a pick-up head reads more data from the optical storage medium continuously until the buffer reaches a buffer threshold if the length is compared shorter than the defect threshold length; and the pick-up head reads a set of replacements for the set of defects directly if the length is compared longer than the defect threshold length.