The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Sep. 29, 2006
Applicant:
Matthew Yeo, Los Angeles, CA (US);
Inventor:
Matthew Yeo, Los Angeles, CA (US);
Assignee:
Symantec Corporation, Mountain View, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An extrusion detection system prevents the release of sensitive data from an enterprise. The system includes administration module for broadcasting taint instructions, each of which include a definition of sensitive data. The system also includes a plurality of extrusion detection nodes. Each node marks sensitive data as tainted responsive to the taint instructions, marks data that depends on sensitive data as tainted. When the potential release of tainted data is detected, an action is executed responsive to the taint instructions.