The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Dec. 14, 2006
Yaodong Liu, Redmond, WA (US);
Cary L. Mitchell, Renton, WA (US);
John Dunagan, Bellevue, WA (US);
Dana K. Fujimoto, Kent, WA (US);
Yaodong Liu, Redmond, WA (US);
Cary L. Mitchell, Renton, WA (US);
John Dunagan, Bellevue, WA (US);
Dana K. Fujimoto, Kent, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A strategy is described for detecting anomalies in the operation of a data processing environment. The strategy relies on parameter information to detect the anomalies in a detection operation, the parameter information being derived in a training operation. The parameter information is selected such that the detection of anomalies is governed by both a desired degree of sensitivity (determining how inclusive the detection operation is in defining anomalies) and responsiveness (determining how quickly the detection operation reports the anomalies). The detection operation includes specific algorithms for determining undesired trending and spiking in the performance data.