The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2010

Filed:

Aug. 15, 2005
Applicants:

Edgar A. Deyoe, Delafield, WI (US);

John L. Ulmer, Brookfield, WI (US);

Rachael A. Kirchhoff, Milwaukee, WI (US);

Inventors:

Edgar A. DeYoe, Delafield, WI (US);

John L. Ulmer, Brookfield, WI (US);

Rachael A. Kirchhoff, Milwaukee, WI (US);

Assignee:

MCW Research Foundation, Milwaukee, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); A61F 5/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A visual defect simulation system receives a functional field map produced by an MRI system that relates locations in a patient's brain to locations in the patient's field of view. Planned medical operations are indicated at locations in the patient's brain and any resulting vision loss is simulated with a revised functional field map. A scene is displayed and an impairment overlay is produced from the revised functional field map that blocks the scene at locations corresponding to simulated vision loss. The overlay is translated over the scene in response to viewer eye movements detected by a vision-tracking system to present a real-time simulation of the resulting vision loss.


Find Patent Forward Citations

Loading…