The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2010

Filed:

Oct. 03, 2006
Applicants:

Sachindra K. Dash, Scottsdale, AZ (US);

Sujit V. Gaikwad, Glendale, AZ (US);

Konstantinos Tsakalis, Chandler, AZ (US);

Inventors:

Sachindra K. Dash, Scottsdale, AZ (US);

Sujit V. Gaikwad, Glendale, AZ (US);

Konstantinos Tsakalis, Chandler, AZ (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G06F 11/30 (2006.01); G05B 13/02 (2006.01); G05B 9/02 (2006.01); G01R 31/00 (2006.01); G01R 13/00 (2006.01); G01R 29/26 (2006.01); G21C 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus, method, and computer program are provided for controller performance monitoring in a process control system. A level of disturbance associated with the process system is determined, and at least one value identifying a stability measure of a controller in the process system is determined using the determined level of disturbance and operating data associated with operation of the process system. The at least one value is compared to at least one threshold value, and a problem with the controller is identified based on the comparison. As an example, the process system could represent a product production system. Also, the operating data could include at least one of: measurement data from one or more sensors and control data for one or more actuators. The controller may be operable to receive the measurement data and generate the control data.


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