The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Aug. 03, 2006
Walter Beck, Erlangen, DE;
Klaus Mayer, Eckental, DE;
Cecile Mohr, Erlangen, DE;
Jochen Zeltner, Erlangen, DE;
Walter Beck, Erlangen, DE;
Klaus Mayer, Eckental, DE;
Cecile Mohr, Erlangen, DE;
Jochen Zeltner, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method for planning an examination of an examination subject in a magnetic resonance system, the planning of the examination ensues based on a composite overview image that is composed of at least two individual images. A first part of the overview image is acquired and the first part of the overview image is made available to operating personnel of the magnetic resonance system for planning further measurements. A second part of the overview image is acquired and the first part and the second part of the overview image are combined. The combined image of the first part and second part of the overview image is made available for planning further measurements. The first part of the overview image is made available to operating personnel no later than before making the overview image available.