The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Feb. 24, 2004
Daisuke Higashihara, Hyogo, JP;
Shokichiro Hino, Tokyo, JP;
Koichi Tsuchiya, Tokyo, JP;
Tomohiko Endo, Tokyo, JP;
Daisuke Higashihara, Hyogo, JP;
Shokichiro Hino, Tokyo, JP;
Koichi Tsuchiya, Tokyo, JP;
Tomohiko Endo, Tokyo, JP;
Toa Corporation, Kobe-shi, JP;
Etani Electronics Co., Ltd., Tokyo, JP;
Abstract
Resonant frequencies fand fdetected in a resonant space are determined as center frequencies of a dip. Based on measurement values at a speaker and a microphone in the resonant space, a basic amplitude frequency characteristic Ca and a target amplitude frequency characteristic Cd are found. A smoothness degree on a frequency axis is larger in the target amplitude frequency characteristic Cd than the basic amplitude frequency characteristic Ca. A damping level and quality factor of the dip are determined based on a difference between the basic amplitude frequency characteristic Ca and the target amplitude frequency characteristic Cd in the center frequencies fand fof the dip and frequencies near the center frequencies.