The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Dec. 01, 2008
Geoffrey Harding, Hamburg, DE;
Helmut Rudolf Strecker, Hamburg, DE;
Johannes Delfs, Hamburg, DE;
Morpho Detection, Inc., Newark, CA (US);
Abstract
A primary collimator for a multiple inverse fan beam x-ray diffraction imaging (MIFB XDI) system. The MIFB XDI system includes a multi-focus x-ray source (MFXS) defining a plurality of focus points arranged along a length of the MFXS. Each focus point is sequentially activated to emit an x-ray fan beam including a plurality of primary beams each directed to a corresponding convergence point. The primary collimator includes a first diaphragm configured to be positioned with respect to the MFXS. The first diaphragm defines a plurality of first channels through a thickness of the first diaphragm. Each first channel is aligned with a corresponding focus point and configured to transmit the x-ray fan beam. A second diaphragm is positioned with respect to the first diaphragm and defines a plurality of second channels through a thickness of the second diaphragm. Each second channel is axially aligned with a corresponding first channel.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile